Temporal Logic Based Hierarchical Test Generation for Sequential VLSI Circuits
نویسندگان
چکیده
منابع مشابه
Test Generation for Asynchronous Sequential Digital Circuits
The dissertation thesis is aimed at test generation for asynchronous sequential digital circuits, contributes to their timeand cost-effective testing, and indirectly supports their wider application, which improves the performance, the power consumption and the electromagnetic emission of future digital circuits. The main scientific contribution is design of the new test generator (optimized fo...
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ژورنال
عنوان ژورنال: VLSI Design
سال: 1994
ISSN: 1065-514X,1563-5171
DOI: 10.1155/1994/94514